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Effects of Carrier Concentration, Indium Content, and Crystallinity on the Electrical Properties of Indium-Tin-Zinc-Oxide Thin-Film TransistorsKYUNGSOO JANG; RAJA, Jayapal; LEE, Youn-Jung et al.IEEE electron device letters. 2013, Vol 34, Num 9, pp 1151-1153, issn 0741-3106, 3 p.Article

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Improvement of mechanical reliability by patterned silver/Indium-Tin-Oxide structure for flexible electronic devicesBAEK, Kyunghyun; JANG, Kyungsoo; LEE, Youn-Jung et al.Thin solid films. 2013, Vol 531, pp 349-353, issn 0040-6090, 5 p.Article

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Structural, optical and Raman scattering studies on DC magnetron sputtered titanium dioxide thin filmsKARUNAGARAN, B; KIM, Kyunghae; MANGALARAJ, D et al.Solar energy materials and solar cells. 2005, Vol 88, Num 2, pp 199-208, issn 0927-0248, 10 p.Conference Paper

Argon and nitrogen implantation effects on the structural and optical properties of vacuum evaporated cadmium sulphide thin filmsSENTHIL, K; MANGALARAJ, D; NARAYANDASS, Sa K et al.Semiconductor science and technology. 2002, Vol 17, Num 2, pp 97-103, issn 0268-1242Article

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